• Home
  • Elemental Analysis

Products

Atomic Absorption
Overviewback to top

AAS (Atomic Absorption Spectrophotometers)

partozist

Since introducing its first atomic absorption spectrophotometer in 1968, Shimadzu has continued to lead the field of inorganic compound analysis. Shimadzu now offers the AA-7000. This flexible system provides users with best-in-class sensitivity, and can be customized into a low-cost single-purpose model and a fully automatic general-purpose system. The AA-7000 also employs various safety features, and it is the world’s first AA spectrophotometer which employs an automatic quench function, which works in case of detection of an earthquake. The Wizard workstation software is also improved and can be linked to CLASS-Public Agent software to provide compliance with FDA 21 CFR Part11.

Operationback to top

Information is loading...

Specificationback to top

Information is loading...

Catalogueback to top
AA-7000 Atomic Absorption Spectrophotometer

To view and download the Catalogue click it.

AA-6200 Atomic Absorption Spectrophotometer

To view and download the Catalogue click it.

Plasma emission
Overviewback to top

ICP (Inductively Coupled Plasma Atomic Emission Spectro)

partozist

ICP-AES introduce sample solutions by spraying them into plasma generated by an induction coil supplied with a high frequency current. The resulting thermal energy excites the sample elements and produces light. The spectrometer separates this light into characteristic spectra of the constituent elements, and from the intensity of spectra determines the type of elements (qualitation) and their concentration (quantitation) in the sample. The ICPE-9000 is a high-speed multitype system featuring a large one-inch CCD for low noise and fully featured ICPE solution software.

Operationback to top

Information is loading...

Specificationback to top

Information is loading...

Catalogueback to top
ICPE-9800 Multi type ICP

To view and download the Catalogue click it.

ICPS-8100 Twin Sequential ICP

To view and download the Catalogue click it.

ICPS-7510 Sequential ICP

To view and download the Catalogue click it.

EDX و XRF
Overviewback to top

XRF, EDX (X-Ray Fluorescence Spectrometers)

partozist

X-ray fluorescence spectrometers irradiate samples with X-rays and measure the characteristic wavelengths or energy in the secondary X-rays (X-ray fluorescence) generated from the sample. They are able to identify the type of constituent elements in samples (qualitative analysis) and measure the concentration of each (quantitative analysis). Since samples can be analyzed non-destructively and without contacting the sample, X-ray fluorescence spectrometers can be used for a wide range of applications, regardless of whether the sample is a solid, liquid, powder or other form. Shimadzu offers two types of X-ray fluorescence spectrometers – wavelength dispersive systems, which provide outstanding detection of trace substances, and energy dispersive systems, which are compact and able to analyze samples easily and rapidly.

Operationback to top

Information is loading...

Specificationback to top

Information is loading...

Catalogueback to top

Energy Dispersive X-Ray Fluorescence Spectrometers

EDX-720/800HS Energy Dispersive X-Ray Fluorescence Spectrometer

To view and download the Catalogue click it.

EDX GP/LE Energy Dispersive X-Ray Fluorescence Spectrometer

To view and download the Catalogue click it.

EDX-7000/8000 Energy Dispersive X-Ray Fluorescence spectrometer

To view and download the Catalogue click it.

Wavelength Dispersive X-Ray Fluorescence Spectrometers

XRF-1800 Sequential Analyzer

To view and download the Catalogue click it.

MXF-2400 Simultaneous Multiple Element Analyzer

To view and download the Catalogue click it.

XRD
Overviewback to top

XRD (X-Ray Diffractometers)

partozist

When a sample is irradiated with X-rays, a variety of signal types can be obtained. Of those signals, X-ray diffraction reveals the crystalline state of samples. Analyzing these diffracted X-rays allows learning about the crystalline structure of samples. XRD series spectrometers are powder X-ray diffractometers used primarily to identify constituents of powder (multicrystalline) samples (qualitative analysis) and determine their concentration (quantitative analysis). For example, they can be used to precisely determine the lattice constant, crystallite size, lattice distortion or degree of crystallization of released silicic acid or asbestos by qualitatively and quantitatively analyzing the samples and also numerically analyzing their diffraction X-ray profile. Furthermore, a variety of optional products are available to allow other analytical applications such as observing changes in crystalline structure as temperature varies or measuring residual stresses.

Operationback to top

Information is loading...

Specificationback to top

Information is loading...

Catalogueback to top
XRD-6100 Vertical Goniometer type

To view and download the Catalogue click it.

XRD-7000 Horizontal Goniometer type

To view and download the Catalogue click it.