XRF, EDX (X-Ray Fluorescence Spectrometers)
X-ray fluorescence spectrometers irradiate samples with X-rays and measure the characteristic wavelengths or energy in the secondary X-rays (X-ray fluorescence) generated from the sample. They are able to identify the type of constituent elements in samples (qualitative analysis) and measure the concentration of each (quantitative analysis). Since samples can be analyzed non-destructively and without contacting the sample, X-ray fluorescence spectrometers can be used for a wide range of applications, regardless of whether the sample is a solid, liquid, powder or other form. Shimadzu offers two types of X-ray fluorescence spectrometers – wavelength dispersive systems, which provide outstanding detection of trace substances, and energy dispersive systems, which are compact and able to analyze samples easily and rapidly.