ICP (Inductively Coupled Plasma Atomic Emission Spectro)

ICP-AES introduce sample solutions by spraying them into plasma generated by an induction coil supplied with a high frequency current. The resulting thermal energy excites the sample elements and produces light. The spectrometer separates this light into characteristic spectra of the constituent elements, and from the intensity of spectra determines the type of elements (qualitation) and their concentration (quantitation) in the sample. The ICPE-9000 is a high-speed multitype system featuring a large one-inch CCD for low noise and fully featured ICPE solution software.

XRF, EDX (X-Ray Fluorescence Spectrometers)

X-ray fluorescence spectrometers irradiate samples with X-rays and measure the characteristic wavelengths or energy in the secondary X-rays (X-ray fluorescence) generated from the sample. They are able to identify the type of constituent elements in samples (qualitative analysis) and measure the concentration of each (quantitative analysis). Since samples can be analyzed non-destructively and without contacting the sample, X-ray fluorescence spectrometers can be used for a wide range of applications, regardless of whether the sample is a solid, liquid, powder or other form. Shimadzu offers two types of X-ray fluorescence spectrometers – wavelength dispersive systems, which provide outstanding detection of trace substances, and energy dispersive systems, which are compact and able to analyze samples easily and rapidly.

XRD (X-Ray Diffractometers)

When a sample is irradiated with X-rays, a variety of signal types can be obtained. Of those signals, X-ray diffraction reveals the crystalline state of samples. Analyzing these diffracted X-rays allows learning about the crystalline structure of samples. XRD series spectrometers are powder X-ray diffractometers used primarily to identify constituents of powder (multicrystalline) samples (qualitative analysis) and determine their concentration (quantitative analysis). For example, they can be used to precisely determine the lattice constant, crystallite size, lattice distortion or degree of crystallization of released silicic acid or asbestos by qualitatively and quantitatively analyzing the samples and also numerically analyzing their diffraction X-ray profile. Furthermore, a variety of optional products are available to allow other analytical applications such as observing changes in crystalline structure as temperature varies or measuring residual stresses.